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小敏给大家介绍一下(slow)QTestStationSeries太阳能电池光谱响应/量子效率(QE/IPCE)测试系统,以下(slow)QTestStationSeries太阳能电池光谱响应/量子效率(QE/IPCE)测试系统的内容是小敏网上整理,希望对您有用。
| QTest Station 1000 / 2000 Solar Cell Quantum Efficiency or IPCE Measurement System | 
| Features: | Applicable Photovoltaic Devices: | 
| ◆ A turn key, fully automatic QE / IPCEmeasurement | Silicon | 
| station in compliance with all major international | Si (crystalline) | 
| standards for PV testing,such as ASTM and IEC | Si (multicrystalline) | 
| etc. | Si (thin-film transfer) | 
| ◆State of the art system suited for all categories of | Amorphous/nanocrystalline Si | 
| PV devices | Si (amorphous) | 
| ◆Multi-junction solar cell measurement | Si (nanocrystalline) | 
| ◆Extremely stable light source and high signalto | III–V cells | 
| noise ratio | GaAs (crystalline) | 
| ◆Wide spectral range from deep UV to MID-IR, | GaAs (thin film) | 
| extendable to other range | GaAs (multicrystalline) | 
| ◆Integrating sphere module for both External QE | InP (crystalline) | 
| and Internal QE testing | Thin-film chalcogenide | 
| ◆Measurement of PV devices with slow time | CIGS (cell) | 
| response, such as dye sensitised | CdTe (cell) | 
| ◆Calculation of Isc under AM0, AM1.5D and AM1.5G | Photochemical | 
| ◆System expandable to PL measurement with | Dye sensitised | 
| optional modules for customers with limited budget | Organic | 
| ◆Advanced modular design with a great variety of | Organic polymer | 
| options to best fit the need of inpiduallaboratory | Multijunction devices | 
| ◆ Intuitive Interface for operations | GaInP/GaAs/Ge | 
| ◆Appropriate for use in either research and | GaInP/GaAs | 
| development applications or in product quality | GaAs/CIS (thin film) | 
| control by manufacturers | a-Si/mc-S | 
| The spectral responsivity of a photovoltaic device is useful for understanding device performance andmateria | 
| characteristics. The quantum efficiency (QE) or IPCE is a quantity defined as the percentage of photons | 
| hitting the photoreactive surface that will produce the current obtained outside the device,and normally reported | 
| over the wavelength range λ.(unit: nm) to which the device responds: | 
| QE(λ) = 1240 R(λ)/λ | 
| In which, R(λ) (unit: A/W) is defined as the output current (short circuit current) per input irradiance | 
| or radiant power at a given wavelength. | 
| QE or IPCE is an accurate measurement of the device"s electrical sensitivity to light. The Quantum Efficiency | 
| of a solar cell is a very important measure for solar cells as it gives information on the current that a given cell | 
| will produce when illuminated by a particular wavelength. If the quantum efficiency is integrated (summed) over | 
| the whole solar electromagnetic spectrum, one can evaluate the current that a cell will produce | 
| when exposed to the solar spectrum. The ratio between this current and the highest possible | 
| current(if the QE was * over the whole spectrum) gives the electrical efficiency of the solar cell. System Specifications: | 
| Wavelength Range | Light Source | 250nm – 2500nm, Other Wavelength Optional | 
| Monochromator | 185nm – 3600nm, Others Wavelength Optional | 
| Calibration Detector | Si: 200 nm – 1100nm | 
| InGaAs and Others Optional | 
| Wavelength Resolution | 0.1nm – 20nm | 
| Stray Light | Single Monochromator, Better Than 10-4at 220nm (Nal) For QTest 1000 | 
| Double Monochromator, Better Than 10-9 at 220nm (Nal) For QTest 2000 | 
| Sample Illuminating Area | From Sub-millimeter to 156x156mm or larger, User Changeable | 
| Sample Chamber | D500 x W400 x H250mm, Other Size Optional | 
| Data Acquisition Module | AC Measurement: Lock-in AmplifierSensitivity: 2 nV to 1 VCurrent input: 106 or 108 V/A | 
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| DC Measurement: Multimeter / Source Meter and Pre-amplifier | 
| Computer Interface | RS232 Standard, USB and IEEE-488 optional | 
| Software | Hardware Setup and Control:Wavelength ScanningInput / Output Slits AdjustmentGratings changingFilter Wheel ControlSetup and Data Collection of Lock-in Amplifier or Multimeter / Source Meter | Data Acquisition:Real Time DisplaySystem CalibrationData AnalyzingData StorageReport printingReflectivity and Transmittance for EQE and IQE | 
| Other options | Temperature ControlMultijunction Cell Measurements |